W. Mamanee

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Triggering uniformity and current sharing under TLP stress is investigated in low voltage multi-finger gg-NMOS and NPN ESD protection devices fabricated in smart-power SOI technology. Inhomogeneous current distribution over the fingers and within a single finger is detected by the backside transient interferometric mapping (TIM) technique. 2D TCAD device(More)
0026-2714/$ see front matter 2011 Elsevier Ltd. A doi:10.1016/j.microrel.2011.07.016 ⇑ Corresponding author. E-mail address: dionyz.pogany@tuwien.ac.at (D. P Transient Interferometric Mapping (TIM) tools are reviewed from a perspective of their particular application area and comparison to other transient optical analysis techniques. TIM studies on trigger(More)
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