Visvesh Sathe

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Supply-noise measurement techniques are becoming increasingly critical in modern digital design, driven by the trend toward smaller, lower-voltage domains. All-digital measurement modules capable of meeting bandwidth and resolution requirements would enable spatially fine supply voltage measurements across Systems-on-Chip. Existing implementations either(More)
Modern Systems-on-Chip(SoCs) frequently power-off individual voltage domains to save leakage power across a variety of applications, from large-scale heterogeneous computing to ultra-low power systems in IoT applications. However, the considerable energy stored within the capacitance of the powered-off domain is lost through leakage. In this paper, we(More)
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