Virgil Emil Ilian

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Quantitative Accelerated Life Testing (QALT) is a solution for assessing the reliability of Micro Electro Mechanical Systems (MEMS). A procedure for QALT is shown in this paper and an attempt to assess the reliability level for a batch of MEMS accelerometers is reported. The testing plan is application-driven and contains combined tests: thermal (high(More)
A method for reliability prediction, called SYRP (SYnergetic Reliability Prediction), is presented, based on a combined fuzzy-logic & physics-of-failure approach. SYRP is used for a semiconductor device (thermal sensors) and the estimations, compared with experimental results, prove to be accurate enough. Also, the problems to be solved for using this(More)
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