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Research Reports IWMI's mission is to improve water and land resources management for food, livelihoods and nature. In serving this mission, IWMI concentrates on the integration of policies, technologies and management systems to achieve workable solutions to real problems—practical, relevant results in the field of irrigation and water and land resources.(More)
BACKGROUND & OBJECTIVES Enterococci are important nosocomial agents and serious infections caused by them are often treated with a combination of cell wall inhibitor and aminoglycoside. However, the presence of high level aminoglycoside resistance in these isolates makes this treatment combination ineffective. The prevalence of such isolates in a tertiary(More)
Fault-tolerance is due to the semiconductor technology development important, not only for safety-critical systems but also for general-purpose (non-safety critical) systems. However, instead of guaranteeing that deadlines always are met, it is for general-purpose systems important to minimize the average execution time (AET) while ensuring fault-tolerance.(More)
Wireless sensor network is a highly distributed network of small lightweight wireless sensor nodes, deployed in large numbers to monitor the environment or system. These sensor networks have limitations of system resources like battery power, radio range and processing capability. Low processing power and wireless connectivity make such networks vulnerable(More)
—The function of a circuit under test (CUT) is represented as a transformation on the probability density function of its input excitation, which is a continuous random variable (RV) with Gaussian probability distribution. Probability moments of the output, now a transformed RV, are used as metrics for testing catastrophic and parametric faults in circuit(More)
DC testing of parametric faults in non-linear analog circuits based on polynomial approximation of the functionality of fault free circuit is presented. Classification of circuit under test (CUT) is based on comparison of estimates of polynomial coefficients with those of the fault free circuit. The method needs very little augmentation of circuit to make(More)
—A method of testing for parametric faults of analog circuits based on a polynomial representation of fault-free function of the circuit is presented. The response of the circuit under test (CUT) is estimated as a polynomial in the applied input voltage at relevant frequencies in addition to DC. Classification of CUT is based on a comparison of the(More)