Viktor Dubec

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Smart power DMOSes are analyzed under thermally unstable conditions up to the destruction level using a new compact version of the transient interferometric mapping (TIM) method. High accuracy phase measurements are achieved employing superluminescent diodes and focal plane array cameras. Twodimensional thermal mapping at two time instants during a single(More)
Thermal distribution during a current gain collapse event is investigated in multi-finger InGaP/GaAs HBTs using the transient interferometric mapping method. The onset of the collapse is observed at time of about 1ms in devices with a low emitter ballasting resistance R<sub>E</sub>, while for HBTs with a high R<sub>E</sub>, the current is distributed(More)
A 2D backside transient interferometric mapping (TIM) method for nanosecond thermal energy imaging at multiple time instants during a single stress event is introduced. The method is based on fringe interferometry and the interferograms are analyzed using the Fast Fourier Transform technique. The method is applied to investigate moving current filaments in(More)
A composite of the conjugate conductive polymer poly(2-methoxy-5-(2-ethylhexyloxy)-1,4-phenylenevinylene) (MEH-PPV) and CdSe/ZnS quantum dots (QDs) is utilized for nanoimprinted lasers after drop-casting onto one-dimensional omnidirectional Bragg mirrors. Strong amplified spontaneous emission is observed at the resonances of both the QDs and the polymer.(More)
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