Vedran Vonk

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The solid-liquid interface formed by single terminated muscovite mica in contact with two different ionic solutions is analyzed using surface X-ray diffraction. Specular and nonspecular crystal truncation rods of freshly cleaved mica immersed in CsCl or RbBr aqueous solution were measured. The half monolayer of the surface potassium ions present after the(More)
V. Vonk,1,2,* J. Huijben,3 D. Kukuruznyak,1 A. Stierle,1,4 H. Hilgenkamp,3 A. Brinkman,3 and S. Harkema3 1Max Planck Institute for Metals Research, Stuttgart, Germany 2Radboud University Nijmegen, Institute for Molecules and Materials, Nijmegen, The Netherlands 3MESA + Institute for Nanotechnology, University of Twente, Enschede, The Netherlands(More)
V. Vonk,1,* M. Huijben,1,† K. J. I. Driessen,1 P. Tinnemans,2 A. Brinkman,1 S. Harkema,1 and H. Graafsma2,‡ 1Low Temperature Division and MESA Research Institute, University of Twente, P.O. Box 217, 7500AE Enschede, The Netherlands 2European Synchrotron Radiation Facility, 6 rue Jules Horowitz, 38043 Grenoble, France Received 3 November 2006; revised(More)
We report an in situ surface X-ray diffraction study of liquid AuIn metal alloys in contact with zinc-blende InP (111)(B) substrates at elevated temperatures. We observe strong layering of the liquid metal alloy in the first three atomic layers in contact with the substrate. The first atomic layer of the alloy has a higher indium concentration than in bulk.(More)
Article history: Received 27 July 2015 Received in revised form 7 January 2016 Accepted 22 January 2016 Available online 26 January 2016 25 nm thick Gd-doped ceria thin films were grown on yttria-stabilized zirconia (YSZ) substrates with (110) and (111) orientation by pulsed laser deposition to study both their crystalline structure and interfacial(More)
We employed operando anomalous surface X-ray diffraction to investigate the buried interface between the cathode and the electrolyte of a model solid oxide fuel cell with atomic resolution. The cell was studied under different oxygen pressures at elevated temperatures and polarizations by external potential control. Making use of anomalous X-ray diffraction(More)
The initial heteroepitaxial growth of YBa{2}Cu{3}O{7-delta} films on SrTiO3(001) substrates during pulsed laser deposition shows a growth-mode transition and a change of growth unit. The growth starts with two blocks, each two-thirds the size of the complete unit cell. The first of these blocks grows in a step-flow fashion, whereas the second grows in the(More)
A sample chamber has been constructed for studying the growth of thin films by pulsed laser deposition in situ with surface X-ray diffraction. The achievable temperature ranges from room temperature to 1073 K in a controlled oxygen environment. The partial pressure of the oxygen background gas covers the range from 0.1 to 10(5) Pa. The first results,(More)
Our in situ X-ray study shows that a silicon substrate in contact with an undersaturated In(Ge) solution is wetted by an approximately 1 nm thin germanium film, which does not grow any thicker. The results can be understood by the use of thickness-dependent correlated interfacial energies. This near-equilibrium heterogeneous interface structure marks the(More)