Valeriy Sukharev

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Physics-based electromigration assessment for power grid networks

Jinxin Huang, Tan Yu, Valeriy Sukharev, Sheldon X.-D. Tan
2014 51st ACM/EDAC/IEEE Design Automation…
2014

This paper presents a novel approach and techniques for physics-based electromigration (EM) assessment in power delivery networks of VLSI systems. An increase in the voltage drop above the threshold… (More)

Microstructure Effect on EM-Induced Degradations in Dual Inlaid Copper Interconnects

Valeriy Sukharev, Armen Kteyan, Ehrenfried Zschech, W. D. Nix
IEEE Transactions on Device and Materials…
2009

A novel physical model and a simulation algorithm are used to predict electromigration (EM)-induced stress evolution in dual inlaid copper interconnects. The aim of the current simulation was to… (More)

A model for electromigration-induced degradation mechanisms in dual-inlaid copper interconnects

Valeriy Sukharev, Ehrenfried Zschech
IEEE International Integrated Reliability…
2004

Incorporation of all important atom migration driving forces into the mass balance equation and its solution together with solution of the coupled electromagnetics, heat transfer, and elasticity… (More)

Physically based simulation of electromigration-induced degradation mechanisms in dual-inlaid copper interconnects

Valeriy Sukharev
IEEE Transactions on Computer-Aided Design of…
2005

Physically based simulations are used to predict an electromigration (EM)-induced void nucleation and growth in dual-inlaid copper interconnects. Incorporation of all important atom migration driving… (More)

Electromigration recovery modeling and analysis under time-dependent current and temperature stressing

Jinxin Huang, Valeriy Sukharev, Taeyoung Kim, Hai-Bao Chen, Sheldon X.-D. Tan
2016 21st Asia and South Pacific Design…
2016

Electromigration (EM) has been considered to be the major reliability issue for current and future VLSI technologies. Current EM reliability analysis is overloaded by over-conservative and simplified… (More)

Learning-based dynamic reliability management for dark silicon processor considering EM effects

Taeyoung Kim, Jinxin Huang, Hai-Bao Chen, Valeriy Sukharev, Sheldon X.-D. Tan
2016 Design, Automation & Test in Europe…
2016

In this article, we propose a new dynamic reliability management (DRM) technique for emerging dark silicon manycore processors. We formulate our DRM problem as minimizing the energy consumption… (More)

Fast physics-based electromigration checking for on-die power grids

Sandeep Chatterjee, Valeriy Sukharev, Farid N. Najm
2016 IEEE/ACM International Conference on…
2016

Due to technology scaling, electromigration (EM) signoff has become increasingly difficult, mainly due to the use of inaccurate methods for EM assessment, such as the empirical Black's model. In this… (More)

Dynamic electromigration modeling for transient stress evolution and recovery under time-dependent current and temperature stressing

Jinxin Huang, Valeriy Sukharev, Taeyoung Kim, Sheldon X.-D. Tan
Integration
2017

Physics-Based Electromigration Models and Full-Chip Assessment for Power Grid Networks

Jinxin Huang, Armen Kteyan, Sheldon X.-D. Tan, Valeriy Sukharev
IEEE Transactions on Computer-Aided Design of…
2016

This paper presents a novel approach and techniques for physics-based electromigration (EM) assessment in power delivery networks of very large scale integration systems. An increase in the voltage… (More)

IR-drop based electromigration assessment: Parametric failure chip-scale analysis

Valeriy Sukharev, Jinxin Huang, Hai-Bao Chen, Sheldon X.-D. Tan
2014 IEEE/ACM International Conference on…
2014

This paper presents a novel approach and techniques for electromigration (EM) assessment in power delivery networks. An increase in the voltage drop above the threshold level, caused by EM-induced… (More)

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