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A method is given for calculating the monitoring reliability parameters (MRP) for an engineering system with allowance for the drift in the measurement error of the means of measurement (MM). The… (More)
A new approach for developing a secondary-standards base is considered and its fundamentals are given.
The equivalent circuit of this class of devices in the dynamic regime is described most often by a first-order aperiodic linkage. Most extensively utilized at this time for the estimation of the… (More)
The capabilities of interface automated measurement systems incorporating the VXI bus are demonstrated. The configurations of four applied VXI systems are described.
Specific characteristics of metrological support for transducers is discussed, and a formalized library of transducer inspection methods is described. The proposed methods can be used with different… (More)
The definition of assembly and element calibrations is formalized. It is shown that systems exist for which element and assembly calibrations are not equivalent.
Computerized measurement systems (CMS) are based on software-controlled means of measurement (MM) and have input via a shared channel (SC) [i]; they belong to the class of universal measurement… (More)