V. N. Freire

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We investigated the quantitative description of nanoporous silicon morphology and its correlation with electrical and optical properties. We performed first-order as well as second-order statistical analysis of AFM images of nanoporous silicon fabricated by two different methods: reaction-induced-vapor-phase-stain-etch and electrochemical. We also simulated(More)
We study the role of band structure anisotropy on the hole transport in 4H– SiC during the transient regime. For the same strength of the applied electric field, the drift velocity overshoot of the hole is stronger and reaches steady state later when the field is applied perpendicular to the c-axis, than when the field is in the c-axis direction. In both(More)
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