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Physical defects cause behaviors unmodeled by even the best fault simulators, which complicates predic-tive diagnosis. This paper reports on a diagnosis procedure that uses modiied composite signatures constructed from single stuck-at information combined with a lexicographic matching and ranking algorithm. The diagnosis procedure is used to perform(More)
This article describes the Boolean satissability method for generating test patterns for single stuck-at faults in combinational circuits. This new method generates test patterns in two steps: First, it constructs a formula expressing the Boolean diierence between the unfaulted and faulted circuits. Second, it applies a Boolean satissability algorithm to(More)
The advantage to " one test at a time " fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacity of the diagnostic answer. In this paper, we address the problems of pertest fault diagnosis by improving the candidate matching, introducing scoring and ranking techniques, and by(More)
abstract Two approaches have been used to balance the cost of generating eeective tests for ICs and the need to increase the ICs' quality level. The rst approach favors using high-level fault models to reduce test generation costs at the expense of test quality, and the second approach favors the use of low-level, technology-speciic fault models to increase(More)
EEective bridging fault diagnosis requires reducing the , n 2 number of bridging faults to a handful of candidates. A preliminary step can reduce the On 2 candidates to a manageable On candidates by using layout information to eliminate those bridging faults that are very unlikely to be shorted together. This step removes from consideration those faults(More)
We present a new fault simulation algorithm for realistic break faults in the p-networks and n-networks of static CMOS cells. We show that Miller effects can invalidate a test just as charge sharing can, and we present a new charge-based approach that efficiently and accurately predicts the worst case effects of Miller capacitances and charge sharing(More)