Tracy Larrabee

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This article describes the Boolean satisfiability method for generating test patterns for single stuck-at faults in combinational circuits. This new method generates test patterns in two steps: First, it constructs a formula expressing the Boolean diference between the unfaulted and faulted circuits. Second, it applies a Boolean satisjiability algorithm to(More)
This article describes the Boolean satis ability method for generating test patterns for single stuck at faults in combinational circuits This new method generates test patterns in two steps First it constructs a formula expressing the Boolean di erence between the unfaulted and faulted circuits Second it applies a Boolean satis ability algorithm to the(More)
abstract Two approaches have been used to balance the cost of generating eeective tests for ICs and the need to increase the ICs' quality level. The rst approach favors using high-level fault models to reduce test generation costs at the expense of test quality, and the second approach favors the use of low-level, technology-speciic fault models to increase(More)
Physical defects cause behaviors unmodeled by even the best fault simulators, which complicates predic-tive diagnosis. This paper reports on a diagnosis procedure that uses modiied composite signatures constructed from single stuck-at information combined with a lexicographic matching and ranking algorithm. The diagnosis procedure is used to perform(More)
Abstract: Precise failure analysis requires accurate fault diagnosis. A previously proposed method for diagnosing bridging faults using single stuck-at dictionaries was applied only to small circuits, produced large and imprecise diagnoses, and did not take into account the Byzantine Generals Problem for bridging faults. We analyze the original technique(More)
This report is based on a course of the same name given at Stanford University during autumn quarter, 1987. Here's the catalog description: CS 209. Mathematical Writing—Issues of technical writing and the effective presentation of mathematics and computer science. Preparation of theses, papers, books, and " literate " computer programs. A term paper on a(More)
The advantage to “one test at a time” fault diagnosis is its ability to implicate the components of complicated defect behaviors. The disadvantage is the large size and opacity of the diagnostic answer. In this paper, we address the problems of per-test fault diagnosis by improving the candidate matching, introducing scoring and ranking techniques, and by(More)
Diagnostic fault simulation can generate enormous amounts of data. The techniques used to manage this data can have signi cant e ect on the outcome of the fault diagnosis procedure. We rst demonstrate that if information is removed from a fault dictionary, its ability to diagnose unmodeled faults may be severely curtailed even if dictionary quality metrics(More)