Toshihiro Ohara

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Test compression / decompression method using variable length coding is an efficient method for reducing the test application cost, i.e., test application time and the size of the storage of an LSI tester. However, some coding imposes slow test application, and consequently it requires large test application time in spite of its high compression. In this(More)
Test compression / decompression using variable-length coding is an efficient method for reducing the test application cost, i.e., test application time and the size of the storage of an LSI tester. However, some coding techniques impose slow test application, and consequently a large test application time is required despite the high compression. In this(More)
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