Tony Taylor

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Integrated circuits are increasingly designed by embedding pre-designed reusable cores. IEEE P1500 Standard for Embedded Core Test (SECT) is a standard-under-development that aims at improving ease of reuse and facilitating interoperability with respect to the test of such core-based ICs, especially if they contain cores from different sources. This paper(More)
As part of an industry wide effort IEEE is in the process of standardizing the elements of test technology such that plug & play can be achieved when testing SoC designs. This standard under development is a language namely, Core Test Language (CTL), which is introduced in this paper. CTL describes all necessary information for test pattern reuse and the(More)
Much of the historical and current summarization literature has been technology-centered with the questions posed and answered having implications for technology development. Though commercial summarization products have appeared in the market place and developers continue to explore new summarization areas, few papers have been user-centered, examining(More)
This thesis presents a test architecture for reducing the cost of testing an integrated circuit (IC). The cost of testing an IC is based on the volume of test data that needs to be loaded during the testing process and the time required to test the circuit. The proposed solution reduces both these factors using a new architecture to load in(More)
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