Tomasz Wejrzanowski

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The paper presents various methods for quantitative description of material structures. The main focus is on direct methods of description based on image analysis. In particular, techniques for the estimation of the size, shape and spatial distribution of structural elements observed by different microscopic techniques are described. The application of(More)
We present a method of fabricating Ge-doped SiO2 fibers with corrugations around their full circumference for a desired length in the longitudinal direction. The procedure comprises three steps: hydrogenation of Ge-doped SiO2 fibers to increase photosensitivity, recording of Bragg gratings with ultraviolet light to achieve modulation of refractive index,(More)
This study concerns imaging of the structure of materials using AFM tapping (TM) and phase imaging (PI) mode, using probes modified with focused ion beam (FIB). Three kinds of modifications were applied - thinning of the cantilever, sharpening of the tip and combination of these two modifications. Probes shaped in that way were used for AFM investigations(More)
In this technical note we present technological steps of fabrication of high energy throughput SNOM probes. The core-metal coating interface of probes is corrugated what enhances photon-to-plasmon coupling. A strong evanescent field allows for reduction of aperture diameter, which together with skin depth of metal used for coating decide upon resolution.(More)
Intrinsically hydrophobic rare-earth oxides (REOs) have emerged as a robust class of ceramics for a variety of applications. Recently, the hydrophobicity of REOs has been observed experimentally and subsequently scrutinized using electronic structure density functional theory (DFT) calculations. In this work, we applied the DFT method to analyze the(More)
Imaging of the surface of materials by atomic force microscopy under tapping and phase imaging mode, with use of modified probes is addressed. In this study, the circularly shaped holes located in varying distance from the probe base, were cut out by focused ion beam. Such modification was a consequence of the results of the previous experiments (probe tip(More)
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