Tilo Brodbeck

  • Citations Per Year
Learn More
Power law time-to-breakdown voltage acceleration is investigated down to ultra-thin oxides (1.1 nm) in the ESD regime in inversion and accumulation. Breakdown modes, oxide degradation and device drifts under ESD-like stress are discussed as function of the oxide thickness. The consequent impacts on the ESD design window are presented. 2009 Elsevier Ltd. All(More)
HBM ESD sensitivity testing of high pin count devices is a challenge for current testers and the standardized test procedure. Alternative HBM test procedures are described for the test of devices with fewer tester channels than device pins. Experimental results for the ‘‘Split-IO’’ test method are presented and the risks of divergent results are discussed.(More)
  • 1