Thorsten Adler

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We present a new methodology for current driven routing and layout verification for analog applications used to avoid defects due to electromigration. The methodology presented uses a commercial simulator to calculate the current flow at all terminals of the analog circuit. Afterwards maximum currents per terminal are extracted and used as guidance for the(More)
Interconnect with an insufficient width may be subject to electromigration and eventually cause the failure of the circuit at any time during its lifetime. This problem has gotten worse over the last couple of years due to the ongoing reduction of circuit feature sizes. For this reason, it is becoming crucial to address the problems of current densities and(More)
We present the single layer router CDR (Current Driven Router) capable of routing analog multiterminal signal nets with current driven wire widths. The widths used during routing are determined by current properties per terminal gained by simulation or manually specified by circuit designers. The algorithm presented computes a Steiner tree layout satisfying(More)
We present a new automatic routing tool, named AnalogRouter, specifically developed to address the problems of current densities and electromigration in routing of multi-terminal, non-planar signal nets in analog circuits. The contributions of our work are: • a new current characterization method based on current vectors attached to each terminal, •(More)
We present a new methodology for current driven routing and layout verification for analog applications used to avoid defects due to electromigration. The methodology presented uses a commercial simulator to calculate the current flow at all terminals of the analog circuit. Afterwards maximum currents per terminal are extracted and used as guidance for the(More)
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