Thomas Indlekofer

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This article may be used for research, teaching and private study purposes. Any substantial or systematic reproduction, redistribution , reselling , loan or sub-licensing, systematic supply or distribution in any form to anyone is expressly forbidden. Personal use of this material is permitted. Permission from IEEE must be obtained for all other uses, in(More)
This article may be used for research, teaching and private study purposes. Any substantial or systematic reproduction, redistribution , reselling , loan or sub-licensing, systematic supply or distribution in any form to anyone is expressly forbidden. c 2014 IEEE. Personal use of this material is permitted. Permission from IEEE must be obtained for all(More)
This article may be used for research, teaching and private study purposes. Any substantial or systematic reproduction, redistribution , reselling , loan or sub-licensing, systematic supply or distribution in any form to anyone is expressly forbidden. Abstract With increasing transient error rates, distinguishing intermittent and transient faults is(More)
This article may be used for research, teaching and private study purposes. Any substantial or systematic reproduction, redistribution , reselling , loan or sub-licensing, systematic supply or distribution in any form to anyone is expressly forbidden. Abstract Robust circuits can compensate certain faults, but they also pose new challenges for test and(More)
With the decreasing feature size of today's nanoelectronic circuits , the susceptibility to transient failures increases. New robust and self-adaptive designs are developed, which can handle transient error to some extent, but at the same time make testing for permanent faults more difficult. This paper reviews the " signature rollback " scheme as a(More)
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