Thomas Indlekofer

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Nano-electronic circuits and systems are affected by increasing parameter variations and by an increasing susceptibility to soft errors. To improve yield and to compensate errors online, fault tolerance must be added to the design. Observing only the input/output behavior during manufacturing test would be too optimistic for such robust designs, whereas a(More)
Robust circuits are able to tolerate certain faults, but also pose additional challenges for test and diagnosis. To improve yield, the test must distinguish between critical faults and such faults, that could be compensated during system operation; in addition, efficient diagnosis procedures are needed to support yield ramp-up in the case of critical(More)
Small delay faults may be an indicator of a reliability threat, even if they do not affect the system functionality yet. In recent years, Faster-than-at-Speed-Test (FAST) has become a feasible method to detect faults, which are hidden by the timing slack or by long critical paths in the combinational logic. FAST poses severe challenges to the automatic test(More)
With increasing transient error rates, distinguishing intermittent and transient faults is especially challenging. In addition to particle strikes relatively high transient error rates are observed in architectures for opportunistic computing and in technologies under high variations. This paper presents a method to classify faults into permanent,(More)
Robust circuits can compensate certain faults, but they also pose new challenges for test and diagnosis. To avoid unnecessary yield loss, critical faults must be distinguished from faults that can be tolerated during system operation. Furthermore, efficient diagnosis procedures are needed to support yield ramp-up in the case of critical faults. Previous(More)
With the decreasing feature size of today’s nanoelectronic circuits, the susceptibility to transient failures increases. New robust and self-adaptive designs are developed, which can handle transient error to some extent, but at the same time make testing for permanent faults more difficult. This paper reviews the “signature rollback“ scheme as a strategy(More)
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