Thomas E. Marchok

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The research reported in this paper was conducted to identify those attributes, of both sequential circuits and structural, sequential automatic test pattern generation (ATPG) algorithms, which can lead to extremely high test generation times. The retiming transformation is used as a mechanism to create two classes of circuits which present varying degrees(More)
Recently, it has been shown that retiming has a very strong impact on the run time of sequential, structural automatic test pattern generators (ATPGs), as well as the levels of fault coverage and fault efficiency attained. In this paper, we show that retiming preserves testability with respect to a single stuck-at fault test set by adding a prefix sequence(More)