Thomas Bartenstein

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This paper describes an Economic and Return-on-Investment (Roo model for a test methodology that ensures product qual$ for logic devices that are in the 130 nm technology node and below. We describe the key components of the nanometer test methodology (NTM) and how it drives the model. In addition to ensuring product qua& we address the cost of test and(More)
We introduce RATE TYPES, a novel type system to reason about and optimize data-intensive programs. Built around stream languages, RATE TYPES performs static quantitative reasoning about <i>stream rates</i> -- the frequency of data items in a stream being consumed, processed, and produced. Despite the fact that streams are fundamentally dynamic, we find two(More)
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