Thiago A de Assis

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This work investigates the scaled height distribution, ρ(q), of irregular profiles that are grown based on two sets of local rules: those of the restricted solid on solid (RSOS) and ballistic deposition (BD) models. At each time step, these rules are respectively chosen with probability p and r=1-p. Large-scale Monte Carlo simulations indicate that the(More)
This work considers the behavior of the height distributions of the equipotential lines in a region confined by two interfaces: a cathode with an irregular interface and a distant flat anode. Both boundaries, which are maintained at distinct and constant potential values, are assumed to be conductors. The morphology of the cathode interface results from the(More)
The global effects of sudden changes in the interface growth dynamics are studied using models of the Edwards-Wilkinson (EW) and Kardar-Parisi-Zhang (KPZ) classes during their growth regimes in dimensions d=1 and d=2. Scaling arguments and simulation results are combined to predict the relaxation of the difference in the roughness of the perturbed and the(More)
In this work, we present systematic theoretical evidence of a relationship between the point local roughness exponent (PLRE) (which quantifies the heterogeneity of an irregular surface) and the cold field emission properties (indicated by the local current density and the macroscopic current density) of real polyaniline (PANI) surfaces, considered nowadays(More)
The evolution of the surface roughness W of a thin film deposited on a rough substrate is studied with a model of temperature-activated adatom diffusion, irreversible lateral aggregation, and no step energy barrier, in which the main parameter is the ratio R of diffusion and deposition rates. At sufficiently low temperatures (R≲10), the average number of(More)
This work considers the effects of the Hurst exponent (H) on the local electric field distribution and the slope of the Fowler-Nordheim (FN) plot when considering the cold field electron emission properties of rough Large-Area Conducting Field Emitter Surfaces (LACFESs). A LACFES is represented by a self-affine Weierstrass-Mandelbrot function in a given(More)
We present an optimal detrended fluctuation analysis (DFA) and apply it to evaluate the local roughness exponent in nonequilibrium surface growth models with mounded morphology. Our method consists in analyzing the height fluctuations computing the shortest distance of each point of the profile to a detrending curve that fits the surface within the(More)
Using a numerical simulation based on the finite-element technique, this work investigates the field emission properties from clusters of a few emitters at close proximity, by analyzing the properties of the maximum local field enhancement factor ([Formula: see text]) and the corresponding emission current. At short distances between the emitters, we show(More)
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