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— High reliability requirements in many modern applications make soft errors an extremely important design aspect and pose new challenges in nanometer technologies. In addition, timing faults that may escape fabrication tests become a real concern in high complexity, high frequency designs. To confront this situation, a concurrent error detection and(More)
In this paper we show that the already known method of using multiplexers for making the inputs and outputs of the embedded blocks accessible by the primary ports of the Integrated Circuit (IC) can be used for path delay fault testing of the IC. We show that the testing of the IC for path delay faults can be reduced to the testing of each block.(More)