Th Geue

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The glass transition process gets affected in ultrathin films having thickness comparable to the size of the molecules. We observe systematic broadening of the glass transition temperature (T(g)) as the thickness of an ultrathin polymer film reduces below the radius of gyration but the change in the average T(g) was found to be very small. The existence of(More)
  • R Stammer, A R Martin, Th Geue, H Gobel, W Hub, U Pietsch
Atomic force microscopy and x-ray scattering are applied to describe changes in the morphology of Si(100) surfaces due to wet chemical processing. With atomic force microscopy, the rms roughness o in dependence on the lateral scan length XO is measured. Additionally, two lateral order parameters are determined, the lateral correlation length L and Hurst(More)
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