Tatsuo Matsumoto

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To reduce VLSI turnaround t i m e and c o s t , an e f f i c i e n t f a u l t d i agnos i s method must be developed. Electron-beam probing, which al lows observat ion of t h e s i g n a l values wi th in a chip, i s one of t h e promising approaches f o r f a u l t diagnosis . However, i t is s t rong ly des i r ed t h a t t h e number of probes be(More)
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