Tatsuo Matsumoto

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  • T. Matsumoto
  • 2005
The authors described a circuit that can measure the propagation delay of a logic circuit directly even for one fan-out 1 inverter of CMOS 90 nm node technology. High-resolution (1 ps) was obtained by converting the propagation delay to the control voltage of the voltage-controlled delay line (VCDL) in delay-locked loop (DLL). The circuit was fabricated(More)
This paper presents the enhanced characteristics of a newly developed low-loss and low-noise 1200-V insulated gate bipolar transistor (IGBT) module. In order to realize low-noise emission, it is necessary not only to improve the reverse recovery characteristics of the free wheeling diode (FWD) but also to reduce the low-current turn-on dI<sub>C</sub>/dt of(More)
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