Tashfin Hossain

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Typically, single event upset (SEU) testing of analog to digital converters (ADC) has been done with static inputs. A test method, using a beat frequency and code error detection software, is presented. This test method allows for SEU characterization of ultra high speed ADC's, using dynamic inputs that more closely reflect the operating conditions in a(More)
We report on the surface morphology and electrical characteristics of Al2O3/n-Si, TiO2/n-Si, and Al2O3/n-GaN grown on sapphire, metal-oxide-semiconductor (MOS) capacitors. Al2O3 films were deposited on Si and GaN by atomic layer deposition (ALD) at temperatures ranging from 240-300°C. Electrical properties of all samples were investigated using(More)
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