Takeshi Takayama

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This 10-b 50-MSamples/s SAR analog-to-digital converter (ADC) features on-chip digital calibration techniques, comparator offset cancellation, a capacitor digital-to-analog converter (CDAC) linearity calibration, and internal clock control to compensate for PVT variations. A split-CDAC reduces the exponential increase in the number of unit capacitors needed(More)
We looked into the problem that the quantitative values of 123I data vary according to collimator type. First, we made the assumption that the quantitative values of 123I data are degraded by the scattered photons from the 529 keV component which contaminate the 159 keV imaging data. Then, the 123I Dual Window (IDW) method was proposed to improve the(More)
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