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We discuss dynamic stability for single-port SRAM that manifests itself in the difference between minimum operating voltage (Vmin) for longer and shorter word-line (WL) pulse width (T<inf>wl</inf>). The most probable failure points (MPFPs) that determine Vmin for various Twl are investigated. Regarding dual-port SRAM, we identify the MPFP for the worst Vmin(More)
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