Takayoshi Tsutsumi

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The double-differential cross section, analyzing power, polarization and polarization transfer coefficient were measured for the (d,pX) reaction with 65 MeV deuterons for 12C at 14.0' and for 5 8 ~ i at 7.0°, 14.0°, 20.5" and 40.0'. The experimental data were analyzed within the framework of the post form DWBA appropriate for the "spectator breakup", and(More)
We investigate silicon wafer temperature measurement characteristics based on optical low-coherence interferometry by altering the light source wavelength. Variations in Si wafer optical thickness with temperature are expressed by thermal expansion and the refractive index. The optical characteristics determine the measurement precision and range. In this(More)
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