Takahiro J. Yamaguchi

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The overall throughput of automatic test equipment (ATE) is sensitive to the download time of test data. An effective approach to the reduction of the download time is to compress test data before the download. The authors introduced a test data compression method which outperforms other methods for compressing test data [8]. Our previous method is based on(More)
— This paper proposes an improved method of background calibration that reduces production testing time of mixed-signal ICs. Production testing time typically consists of " calibration convergence time " + " functional testing time after calibration convergence ". The method that is proposed here reduces average calibration convergence time. This method(More)
The overall throughput of automatic test equipment (ATE) is sensitive to the download time of test data. An effective approach to the reduction of the download time is to compress test data before the download. A compression algorithm for test data should meet two requirements: lossless and simple decompression. In this paper, we propose a new test data(More)
* The VLSI chip in this study has been fabricated in the chip fabrication program of VLSI Design and Education Center (VDEC), the University of Tokyo with the collaboration by Rohm Corporation and Toppan Printing Corporation. Abstract Some open defects in VLSI circuits may cause delay faults, and testing of open defects and delay faults remain difficult(More)
This paper presents a new jitter tolerance model that includes the effect of deterministic jitter in interconnects. First, it is shown by experiment that the deterministic jitter in a cable can significantly affect its jitter tolerance. Then, the new jitter tolerance model is verified with experimental data on cables of various lengths, using both PRBS and(More)
—This paper describes a new method for extracting both instantaneous and rms sinusoidal jitter from phase-locked loops (PLL) output signals. The method is based on analytic signal theory and utilizes the Hilbert transform to extract phase information from a PLL signal. Both the theoretical basis and fundamental concepts of the new method are explained. A(More)