Takafumi Ohmoto

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A substrate noise analysis methodology is described that simulates substrate noise waveforms at sensitive locations of large-scale mixed-signal ICs. Simulation results for a 7.3mm x 7.3mm chip with 500k devices obtained in a few hours on an engineering server show good correlation with silicon measurements as testing conditions are varied. An analysis of(More)
We report on the characterization of an AC-coupled, double-sided silicon strip detector, with fast binary readout electronics, in a pion beam before and after proton irradiation. The proton irradiation was non-uniform and to increase the damage the detector was heated to accelerate the anti-annealing. The effective radiation level was about 1×10 14 p/cm 2.(More)
A Transition Controllable Noise Source (TCNS) generates substrate noises with controlled transitions in size, interstage delay, and direction. The noises are measured in a 100-ps 100-uV resolution by a linear substrate voltage detector that uses a front-end PMOS source follower probing substrate potential and a back-end latch comparator for(More)
Large area (63.6 mm x 64 mm) n-on-n silicon strip detectors have been fabricated, implementing various p-stop structures in the n-side. The detectors were characterized in laboratory and in beamtests. The beamtests showed that the individual p-stop structure collected less charge in the region between the strips than other p-stop structures. Large area(More)
A Silicon microstrip detector with n-strip readout on the n-bulk Silicon has been fabricated by implementing 4 different p-stop structures in 6 zones in the detector's n-side. The detectors were assembled into the units of detector-electronics modules. The response difference in the p-stop structures and effect of detector strip length were characterized in(More)
SUMMARY Progress of roles and schemes of calibration techniques in data converters are reviewed. Correction techniques of matching error and nonlinearity in analog circuits have been developed by digital assist using high-density and low-power digital circuits. The roles of the calibration are not only to improve accuracy but also to reduce power(More)
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