Takafumi Ohmoto

  • Citations Per Year
Learn More
A substrate noise analysis methodology is described that simulates substrate noise waveforms at sensitive locations of large-scale mixed-signal ICs. Simulation results for a 7.3mm x 7.3mm chip with 500k devices obtained in a few hours on an engineering server show good correlation with silicon measurements as testing conditions are varied. An analysis of(More)
Y. Unno a , H. Kitabayashi b , B. Dick g , T. Dubbs j , A. Grillo j , M. Ikeda b , Y. Iwata b , S. Kashigin j , E. Kitayama h , W. Kroeger j , T. Kohriki a , T. Kondo a , G. Moorhead g , D. Morgan k , I. Nakano h , T. Ohmoto b , T. Ohsugi b , P.W. Phillips i , J. Richardson 1, f 1 , W. Rowe j , H.F.-W. Sadrozinski j , K. Sato b , J. Siegrist e , E. Spencer(More)
A Transition Controllable Noise Source (TCNS) generates substrate noises with controlled transitions in size, interstage delay, and direction. The noises are measured in a 100-ps 100-uV resolution by a linear substrate voltage detector that uses a front-end PMOS source follower probing substrate potential and a back-end latch comparator for(More)
We report on the characterization of an AC-coupled, double-sided silicon strip detector, with fast binary readout electronics, in a pion beam before and after proton irradiation. The proton irradiation was non-uniform and to increase the damage the detector was heated to accelerate the antiannealing. The effective radiation level was about 1×1014 p/cm2.(More)
To test the radiation tolerance of full-size detectors, four large-area AC-coupled single-sided silicon microstrip detectors were fabricated. The detectors had a size of 6 cm×3.4 cm and were made out of a 300 μm thick, high-resistivity, n-type silicon, simulating the p-side of the double-sided silicon microstrip detectors being developed. The AC coupling(More)
Performance Index: We evaluate phase noise of VCO as a performance index of frequency domain, and cycleto-cycle jitter and cycle-jitter, as performance indices of time domain. The cycle-jitter is estimated from the histogram of period (Ti) in oscillation waveform, and, the cycle-to-cycle jitter is estimated by histograming the difference in periods from one(More)
Progress of roles and schemes of calibration techniques in data converters are reviewed. Correction techniques of matching error and nonlinearity in analog circuits have been developed by digital assist using high-density and low-power digital circuits. The roles of the calibration are not only to improve accuracy but also to reduce power dissipation and(More)
Y. Unno a , H. Kitabayashi b , B. Dick g , T. Dubbs j , A. Grillo j , M. Ikeda b , Y. Iwata b , S. Kashigin j , E. Kitayama h , W. Kroeger j , T. Kohriki a , T. Kondo a , G. Moorhead g , D. Morgan k , I. Nakano h , T. Ohmoto b , T. Ohsugi b , P.W. Phillips i , J. Richardson 1,f , W. Rowe j , H.F.-W. Sadrozinski j , K. Sato b , J. Siegrist e , E. Spencer j ,(More)
  • 1