Takafumi Fukushima

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— This Paper presents on 3D stacking technology with 2.5μm x 2.5μm In (Indium) bump connections with adhesive injection [1]. Instead of using the simple test device, this technology has been verified using the actual circuit level test chip. And it was found that the completion of stacking process is affected by the layout pattern of stacked each tier. In(More)
New surface mounting and packaging technologies, using self-assembly with chips having cavity structures, were investigated for three-dimensional (3D) and hetero integration of complementary metal-oxide semiconductors (CMOS) and microelectromechanical systems (MEMS). By the surface tension of small droplets of 0.5 wt% hydrogen fluoride (HF) aqueous(More)
Prior research suggests that predicting defect-inducing changes, i.e., Just-In-Time (JIT) defect prediction is a more practical alternative to traditional defect prediction techniques, providing immediate feedback while design decisions are still fresh in the minds of developers. Unfortunately, similar to traditional defect prediction models, JIT models(More)
A three-dimensional (3-D) integration technology based on the wafer-to-wafer bonding using through silicon vias (TSV's) has been developed for the fabrication of new 3-D LSIs. A 3-D image sensor chip, 3-D shared memory chip, 3-D artificial retina chip and 3-D microprocessor test chip have been fabricated by using this technology. In addition, we have(More)
1. Introduction With the progress of ageing society, the number of blind patients due to retinitis pigmentosa (RP) and age-related macular degeneration (AMD) is dramatically increasing. However, medical cures for these diseases have not yet been established. In the retina of these blind patients, photoreceptor cells that convert optical signal into(More)
Unlike traditional defect prediction models that identify defect-prone modules, Just-In-Time (JIT) defect prediction models identify defect-inducing changes. As such, JIT defect models can provide earlier feedback for developers, while design decisions are still fresh in their minds. Unfortunately, similar to traditional defect models, JIT models require a(More)
  • Yuki Ohara, Akihiro Noriki, Katsuyuki Sakuma, Kang-Wook Lee, Mariappan Murugesan, Jichoel Bea +4 others
  • 2009
We develop novel micro-bumping technology to realize small size, fine pitch and uniform height Cu/Sn bumps. Electroplated-evaporation bumping (EEB) technology, which is a combination of Cu electroplating and Sn evaporation, is developed to achieve uniform height of Cu/Sn bumps. We develop CMOS compatible dry etching processes for removing sputtered Cu/Ta(More)