Tai-Yu Cheng

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A comprehensive variation model is critical to achieve both competitive design and manufacturing yield in advanced technologies. Conventionally, as long as FEOL (front end of line) statistical model is appropriate, BEOL (back end of line) variations given by lumping multiple variation sources into few corners is enough to achieve reliable simulation(More)
A coupling node insertion method (CNIM) is proposed to handle electrical coupling between top metals of on-chip interconnects and silicon substrate surfaces in three-dimensional integrated circuits (3-D ICs). This coupling effect should not be neglected especially as metal area is intentionally increased in order to reduce resistance values. In this paper,(More)
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