Sorry, we do not have enough data to show an influence graph for this author.
- Full text PDF available (0)
- This year (0)
- Last 5 years (0)
- Last 10 years (1)
Journals and Conferences
Gate oxide breakdown has been studied in the circuit-like patterns, i.e. e-Fuse arrays and two-stage inverter circuit. It is observed that time-dependent dielectric breakdown (TDDB) lifetime of eFuse… (More)
In this paper, we described the design of logic-process compatible embedded non-volatile memory (NVM) macro for the application of radio frequency identification (RFID). A prototype 1024-bits NVM… (More)