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For two-pattern at-speed scan testing, the excessive power supply noise at the launch cycle may cause the circuit under test to malfunction, leading to yield loss. This paper proposes a new weight assignment scheme for logic switching activity; it enhances the IR-drop assessment capability of the existing weighted switching activity (WSA) model. By(More)
A one-dimensional conductivity barrier model is introduced to describe the dielectric response and conductivity of BiFeO<inf>3</inf> (BFO) and (Bi<inf>0.95</inf>Nd<inf>0.05</inf>)FeO<inf>3</inf> (BFO-5%Nd) ceramics as functions of temperature and frequency. Good qualitative fits of conductivity and dielectric permittivity in the intermediate-temperature(More)
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