T.E. Mangir

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Redundancy of both logic circuits and interconnections is the core principle of both RVLSI (Restructurable or Fault-Tolerant VLSI) and WSI (Wafer Scale Integration). For varying complexity and sizes of circuits different factors of redundancy are required. Effective use of redundancy requires understanding of the failures and failure modes at different(More)
In a companion paper [34], sources of failures and yield improvement through the use of redundancy for MOS, VLSI, and WSI were discussed. It was shown that interconnection density and complexity determines the effectiveness of the use of redundancy for yield improvement for RVLSI and WSI. The key issue in the use of redundancy is the development of(More)
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