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A new compaction technique based on signature analysis is presented. Rather than comparing the final signature with the expected one after the test is completed, the binary output of the MISA is converted into an alternating binary signal by two simple cover circuits. An error is indicated whenever the alternation of the output signal is disturbed. This(More)
| In this paper, a new modied BIST structure is investigated. The output of the MISA is monitored during the test by an error detection circuit which is composed of two simple cover circuits. To simplify the cover construction, the cover circuits are randomly chosen to be active for some of the outputs of the MISA. Thus, a time-consuming fault simulation(More)
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