Susana Ferrero

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The main focus of our work is the characterization and structural study of 4H-silicon carbide (SiC) normally-off vertical junction field effect transistor (JFET). We will determine the experimental static I<sub>ds</sub>-V<sub>ds</sub> characteristics under temperature variation. In order to achieve a better description of SiC and metal interface properties,(More)
We present the assessment of two classification procedures using a Monte Carlo experience and Landsat data. Classification performance is hard to assess with generality due to the huge number of variables involved. In this case, we consider the problem of classifying multispectral optical imagery with pointwise Gaussian maximum likelihood and contextual ICM(More)
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