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Health management and reliability are fundamental aspects of the design and development cycle of power electronic products. This paper presents the prognostic evaluation of a power electronic IGBT module. To achieve this aim, a simple state-based prognostic (SSBP) method has been introduced and applied on the data which was extracted from an aged power(More)
Health management and reliability are fundamental part of the design and development cycle of the power electronic products. This paper presents the study and investigation about the prognostic and health management of power electronic IGBT module. To achieve this aim, a fusion approach has been introduced. In addition, for the physic based part of(More)
Within the field of Integrated System Health Management, ISHM, there is still a lack of adequate prognostic models for critical applications while systems are missioned to work in harsh environments. One of the main challenges is that prognostic models should be adaptive to changes in working conditions so that prediction of the remaining useful life of(More)
—The accurate estimation of the remaining useful life (RUL) of various components and devices used in complex systems, e.g., airplanes remain to be addressed by scientists and engineers. Currently, there area wide range of innovative proposals put forward that intend on solving this problem. Integrated System Health Management (ISHM) has thus far seen some(More)
Electromagnetic relays provide a well proven solution to switching loads in a variety of applications. However, relays are known for their limited reliability due to mechanical wear of internal switching elements, essentially the life of the relay may be determined by the life of the contacts. Failure to trip, spurious tripping and contact welding, can in(More)
The aim of this paper is to develop a real time conditional monitoring of the inverter based on IGBT. IGBT failure model has been developed by using fuzzy logic that adapts prognostic model with the fuzzy nature of failure mechanism. In this way it is possible to efficiently estimate the remaining useful life (RUL) of Insulated Gate Bipolar Transistor(More)
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