Sunhom Steve Paak

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The programming characteristics and reliability of NiSi polysilicon fuse fabricated using 65nm logic CMOS technology were studied. Under optimal programming conditions, high post-program resistance can be achieved. These well programmed fuses showed good data retention, capable of meeting the operating lifetime requirement of most applications
We correlate transmission electron microscope (TEM) pictures of superconducting In contacts to an AlGaAs/GaAs heterojunction with differential conductance spectroscopy performed on the same heterojunction. Metals deposited onto a (100) AlGaAs/GaAs heterostructure do not form planar contacts, but, during thermal annealing, grow down into the heterostructure(More)
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