Sungyoul Seo

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From the advent of very large scale integration (VLSI) design, a larger power consumption of a scan-based testing has been one of the most serious problems. The large number of scan cells lead to excessive switching activities during the scan shifting operations. In this paper, we present a new scan shifting method based on clock gating of multiple groups(More)
The exponential advance in semiconductor manufacturing technology is bringing heavy increase not only in power consumption but in test data volume as well. Moreover, power consumption in test mode is much higher than that in the functional operation mode. In this paper, a low power scan bypass technique is proposed to reduce both the test data volume and(More)
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