Sun Lanyi

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Deep-Level Spectroscopy, based on transformation and analysis of capacitance or charge transients, following the excitation of the sample by voltage pulses, yields information on electrically active defects in semiconductors, hardly obtainable by other methods. Our microscope performs Isothermal Charge-Transient Spectroscopy (IQTS). It samples the(More)
The performance of a novel instrument, the Scanning Charge-Transient Microscope, is demonstrated by analysis of defect states in thin-film transistors fabricated in location-controlled single-grain crystallised amorphous silicon. In the instrument, the principle of Isothermal Charge-Transient Spectroscopy is implemented. Its heart is a sensitive(More)
The capacitance of approximately conical scanning capacitance microscope probes placed perpendicularly over a conducting plane has been modelled using the finite element method. The dependence on tip/surface distance, radius of curvature of the tip apex, cone angle and height has been analysed. Both shielded and unshielded probes have been considered. The(More)
Computational Fluid Dynamics (CFD) simulations of internal loop reactor for heavy oil slurry bed hydroprocessing have been done in commercial code Fluent 6.3 using Euler two-phase flow model and standard k-ε turbulence model. The effects of the physical properties on the flow field in the reactor are investigated. The results show that the gas density has(More)
We present an analysis of the measurement error caused by the stray field of scanning capacitance microscope probes of various shapes. Cylindrical islands and wells of varying radius and height or depth, in both conducting surfaces and structures containing dielectric films, were used as test features for modelling. The results show that high accuracy and(More)
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