Subarna Sinha

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Thickness range, i.e. the difference between the highest point and the lowest point of the chip surface, is a key indicator of chip yield. This paper presents a novel metal filling algorithm that seeks to minimize the thickness range of the chip surface during the copper damascene process. The proposed solution considers the physical mechanisms in the(More)
In the last decade there has been a rapid expansion in clinical trials using mesenchymal stromal cells (MSCs) from a variety of tissues. However, despite similarities in morphology, immunophenotype, and differentiation behavior in vitro, MSCs sourced from distinct tissues do not necessarily have equivalent biological properties. We performed a genome-wide(More)
This paper introduces the concept of via range patterns and incompletely specified range patterns to represent new types of process-hotspots. Via range patterns can represent process-hotspots containing vias that are a major source of lithography issues. An incompletely specified range pattern can accurately and succinctly represent a process-hotspot where(More)
In current manufacturing processes, certain layout configurations are likely to have reduced yield and/or reliability due to increased susceptibility to stress effects or poor tolerance to certain processes like lithography. These problematic layout configurations need to be efficiently detected and eliminated from a design layout to enable better yield. In(More)
In advanced fabrication technology, the sub-wavelength lithography gap causes unwanted layout distortions. Even if a layout passes design rule checking (DRC), it still might contain process hotspots, which are sensitive to the lithographic process. Hence, process-hotspot detection has become a crucial issue. In this paper, we propose an accurate(More)
Acute myeloid leukemia (AML) is associated with deregulation of DNA methylation; however, many cases do not bear mutations in known regulators of cytosine guanine dinucleotide (CpG) methylation. We found that mutations in WT1, IDH2, and CEBPA were strongly linked to DNA hypermethylation in AML using a novel integrative analysis of The Cancer Genome Atlas(More)
A distance metric of patterns is crucial to hotspot cluster analysis and classification. In this paper, we propose an improved tangent space based metric for pattern matching based hotspot cluster analysis and classification. The proposed distance metric is an important extension of the well-developed tangent space method in computer vision. It can handle(More)
Alternating-aperture phase shift masking (AAPSM), a form of strong resolution enhancement technology (RET) is used to image critical features on the polysilicon layer at smaller technology nodes. This technology imposes additional constraints on the layouts beyond traditional design rules. Of particular note is the requirement that all critical features be(More)
In deep submicron feature sizes continue to shrink aggressively beyond the natural capabilities of the 193 nm lithography used to produce those features thanks to all the innovations in the field of resolution enhancement techniques (RET). With reduced feature sizes and tighter pitches die level variations become an increasingly dominant factor in(More)
In this paper, we present a novel algorithm for 3D floorplanning with fixed outline constraints and a particular emphasis on thermal awareness. A computationally efficient thermal model that can be used to guide the thermal-aware floorplanning algorithm to reduce the peak temperature is proposed. We also present a novel white space redistribution algorithm(More)