Struan M Gray

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Understanding friction and adhesion at a fundamental level is a long-standing challenge that has been lent a contemporary relevance by the need to prevent stiction and wear in the fields of microelectromechanical systems (MEMS) and nanoelectromechanical systems (NEMS). Since the invention of the atomic force microscope (AFM), studies of friction between the(More)
We present a noninvasive optical method to determine the local strain in individual semiconductor nanowires. InP nanowires were intentionally bent with an atomic force microscope and variations in the optical phonon frequency along the wires were mapped using Raman spectroscopy. Sections of the nanowires with a high curvature showed significantly broadened(More)
Submitted for the MAR07 Meeting of The American Physical Society Shear stress measurements on InAs nanowires by AFM manipulation HAKAN PETTERSSON, Halmstad University, M. BORDAG, Leipzig University, A. RIBAYROL, G. CONANCHE, L.E. FRÖBERG, L. SAMUELSON, L. MONTELIUS, Lunds University — In this paper, we report on a novel approach to measure shear stress(More)
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