Steve Palosh

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As process technology further scales, aging, noise and variations in integrated circuits (ICs) and systems become a major challenge to both the semiconductor and electronic design automation (EDA) industries, which may cause significantly increased mismatch between modeled and actual silicon behavior, and even IC failure in field. Therefore, the addition of(More)
As process technology further scales, aging, noise and variations in integrated circuits (ICs) and systems become a major challenge to both the semiconductor and EDA industries, since a significantly increased mismatch is emerging between modeled and actual silicon behavior. Therefore, the addition of accurate and low-cost on-chip sensors is of great value(More)
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