Steve Griffith

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The Aeroflex UT699 LEON 3FT RHBD microprocessor was tested for SEE. Testing showed the UT699 is sensitive to a register SEE above LET = 10 MeV-cm^2/mg which is of limited impact due to a space rate of approximately 5E-6/device-year. This is on the same order of magnitude with earlier SEE rates predicted from FF upsets. Results were also collected for(More)
How can the semiconductor industry improve the communication between what is done up front in the design, and what is done downstream in the fab and during test? This panel will examine whether product test can provide the necessary "grand unification" to solve today's broken handoffs between DFM, test chips, and fab yield management systems. Questions(More)
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