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Fluctuations in intrinsic linear V<inf>t</inf>, free of impact of parasitics, are measured for large arrays of NMOS and PMOS devices on a testchip in a 150nm logic technology. Local intrinsic &#963;V<inf>T</inf>, free of extrinsic process, length and width variations, is random, and worsens with reverse body bias. Although the traditional area-dependent(More)
Challenge and conflict are elements that all game designers strive to engineer into their games. Research shows that challenge is what drives a high proportion of games players yet there are few published tools that can be used to assist the game designer in constructing useful challenges and conflict leading many new game designers to resort to the 'tried(More)
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