Author pages are created from data sourced from our academic publisher partnerships and public sources.
- Publications
- Influence
Comparison of error rates in combinational and sequential logic
- Stephen P. Buchner, M. Baze, D. Brown, D. McMorrow, J. Melinger
- Physics
- 1 December 1997
A pulsed laser was used to demonstrate that, for transients much shorter than the clock period, error rates in sequential logic were independent of frequency, whereas error rates in combinational… Expand
Attenuation of single event induced pulses in CMOS combinational logic
- M. Baze, Stephen P. Buchner
- Physics
- 1 December 1997
Results are presented of a study of SEU generated transient pulse attenuation in combinational logic structures built using common digital CMOS design practices. SPICE circuit analysis, heavy ion… Expand
A digital CMOS design technique for SEU hardening
- M. Baze, Stephen P. Buchner, D. McMorrow
- Physics
- 1 December 2000
A new cell design technique is described which may be used to create SEU hardened circuits. The technique uses actively biased, isolated well transistors to prevent transients in combinational logic… Expand
Laboratory tests for single-event effects
- Stephen P. Buchner, D. McMorrow, J. Melinger, A. B. Camdbell
- Computer Science
- 1 April 1996
TLDR
Demonstration of single-event effects induced by through-wafer two-photon absorption
- D. Mcmorrow, Stephen P. Buchner, W.T. Lotshaw, J. Melinger, M. Maher, M. Savage
- Materials Science
- IEEE Transactions on Nuclear Science
- 20 December 2004
The first demonstration of through-wafer two-photon absorption (TPA) single-event effects (SEEs) testing is presented. We interrogate the single-event transient (SET) response of several different… Expand
Circuit modeling of the LM124 operational amplifier for analog single-event transient analysis
- Y. Boulghassoul, L. Massengill, +6 authors C. Poivey
- Engineering
- 2002
This work presents the development of a transistor-level circuit model of the LM124 operational amplifier specifically engineered and calibrated for analog single-event transient (ASET) computer… Expand
Impact of Total Ionizing Dose on the Analog Single Event Transient Sensitivity of a Linear Bipolar Integrated Circuit
- M. Bernard, L. Dusseau, +6 authors K. Label
- Physics
- IEEE Transactions on Nuclear Science
- 12 December 2007
Total ionizing dose (TID) strongly affects the single event transient (SET) sensitivity of a bipolar linear voltage comparator (LM139). The general rule that transistors in the non-conducting state… Expand
Critical charge for single-event transients (SETs) in bipolar linear circuits
- R. Pease, A. Sternberg, +5 authors T. Turflinger
- Physics
- 1 December 2001
The critical charge for single-event transients (SETS) from heavy ions has been simulated and measured in bipolar linear circuits under several bias conditions. Although in many cases the threshold… Expand
Investigation of millisecond-long analog single-event transients in the LM6144 op amp
- Y. Boulghassoul, Stephen P. Buchner, +8 authors M. Maher
- Engineering
- IEEE Transactions on Nuclear Science
- 20 December 2004
A new category of analog single-event transients (SETs) with millisecond-long durations have been experimentally observed in the LM6144 operational amplifier. It is the first time that events with… Expand
Single Event Transients in Linear Integrated Circuits
- Stephen P. Buchner, D. Mcmorrow
- Engineering
- 2005
On November 5, 2001, a processor reset occurred on board the Microwave Anisotropy Probe (MAP), a NASA mission to measure the anisotropy of the microwave radiation left over from the Big Bang. The… Expand
- 16
- 2
- PDF
...
1
2
3
...