Stephen E. Ralph

Jerry Woodall2
Dave Mcinturff2
Paul Haugsjaa1
2Jerry Woodall
2Dave Mcinturff
1Paul Haugsjaa
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We report the direct measurement of the intrinsic photocurrent response of both top and back illuminated planar metal–semiconductor–metal structures. We directly observe the temporal dynamics of the hole transport dependence on applied bias and the initial spatial distribution using a near infrared tunable femtosecond light source and electrically biased(More)
  • Marian C Hargis, Stephen E Ralph, Jerry Woodall, Dave Mcinturff, Alfred J Negri, Paul Haugsjaa
  • 2004
We report dramatic differences in the impulse response and wavelength dependence of back versus top illimhated Ino.53Gao.47As planar metal-semiconductor-metal devices. Via direct measurement of transit-time limited devices we identify the mechanisms involved and thereby allow the optimum CEeSign of multi-@bit, high responsivity back-illuminated devices. We(More)
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