Stelios Neophytou

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—A method to implicitly derive all tests for each transition fault under established fault-sensitization criteria is presented. The derived quality test functions are enhanced in three different ways to derive better quality test sets. One enhancement restricts fault sensitization along critical subcircuits whose paths have long delays under a fixed-delay(More)
—It has been previously shown that in order to guarantee the temporal correctness of a circuit, only the primitive path delay fault set needs to be tested. However, as in the case of the traditional and simpler path delay fault model, the number of possible faults can be exponential to the circuit size and, therefore, it is only practical to consider the(More)