Stefan Zollner

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concentration and lattice absorption in bulk and epitaxial silicon carbide determined using infrared ellipsometry" We have measured the dielectric function of bulk nitrogen-doped 4H and 6H SiC substrates from 700 to 4000 cm Ϫ1 using Fourier-transform infrared spectroscopic ellipsometry. Photon absorption by transverse optical phonons produces a strong(More)
Optical properties of bulk and thin-film SrTiO 3 on Si and Pt" (2000). We have studied the optical properties ͑complex dielectric function͒ of bulk SrTiO 3 and thin films on Si and Pt using spectroscopic ellipsometry over a very broad spectral range, starting at 0.03 eV ͓using Fourier transform infrared ͑FTIR͒ ellipsometry͔ to 8.7 eV. In the bulk crystals,(More)
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