Stefan Ludwig

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  • Sybille Hellebrand, Christian G Zoellin, Hans-Joachim Wunderlich, Stefan Ludwig, Torsten Coym, Bernd Straube
  • 2007
– The increased number of fabrication defects, spatial and temporal variability of parameters, as well as the growing impact of soft errors in nanoelectronic systems require a paradigm shift in design, verification and test. A robust design becomes mandatory to ensure dependable systems and acceptable yields. Design robustness, however, invalidates many(More)
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